Study and Characterization of Nanocrystalline ZnS: Tb Thin Films deposited by Sol-Gel Method

Tounsi, Amel; Talantikite, D.t.; Merzouk, B, H; Haddad, H.

Journal of Materials, Processes and Environment
Volume 5, Numéro 1, Pages 29-33
2017-05-03

Study And Characterization Of Nanocrystalline Zns: Tb Thin Films Deposited By Sol-gel Method

Authors : Tounsi Amel . Talantikite D.t. . Merzouk B, H . Haddad H. .

Abstract

The thin layers of undopedZnS and ZnS doped Tb (4%) were deposited on glass substrates using sol-gel and dip-coating methods. Thermal treatments have been carried out at 500 °C for 1 hour. The structural characterization of these samples was carried out by the X-rays diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). UV-visible spectrophotometry and Fourier Transform Infrared spectroscopy (FTIR) have been used to study the effect of deposition layers on the optical properties of ZnS doped Tb thin films. X-ray diffraction measurements show that the films are amorphous. Atomic force microscopy images of the films have revealed homogeneous and granular structure and the SEM micrographies show a uniform and porous structure of deposit films. The optical transmission spectra in the UV - visible range have shown that the doped film present a good optical transmission ranging between 60% and 86% in the visible. The gap values are decreasing with doping. FTIR analysis confirm the presence of ZnS band vibration at 617.187 cm-1.