Journal of New Technology and Materials
Volume 7, Numéro 2, Pages 72-75
Authors : Khechba Mourad .
In this study, the influence of increasing of the Al concentration on the structural and optical properties of SnO2 thin films were investigated. Pure and aluminum-doped SnO2 thin films were prepared by sol–gel deposition method on glass and Si (100) substrates at room temperature and then annealed at 550°C in air. The obtained films are characterized by X-ray diffraction (XRD), atomic force microscopy (AFM), and UV–Vis spectrophotometry techniques. A single-phase rutile polycrystalline structure is revealed by XRD. The AFM analysis show that the surface morphology changes with Al concentration. The un-doped and Al-doped SnO2 thin films are transparent (86% optical transmittance) in the near UV-Vis, and the optical band gap is influenced by Al doping level.
Al-doped SnO2; sol–gel; XRD; AFM; UV-Vis.
بوسالم أحلام
.
عابد يوسف
.
ص 117-132.
Yahia Zeghoudi
.
pages 74-88.
Abbas Soumaia
.
Ben Haoua Atman
.
Ben Haoua Boubaker
.
Rahal Achour
.
pages 106-111.
Rahmane Saâd
.
Kouidri Nabila
.
pages 56-62.
Kavitha B.
.
Dhanam M.
.
pages 603-612.