Communication science et technologie
Volume 21, Numéro 2, Pages 21-26
2023-12-25
Optical And Electrical Characterization Of Meh-ppv Organic Heterostructure
Authors : Benhaliliba Mustpha . Kaleli M . Sen E .
Abstract
ABSTRACT MEH-PPV thin layer is grown onto silicon substrate by ultrasonic spray pyrolysis process to achieve Ag/MEH-PPV/Si/Al heterostructure. Optical transmittance is measured using UV-Vis spectrophotometer and I-V characteristics under dark and light conditions are measured and electrical parameters are extracted. Based on optical measurement, 140 nm thick film exhibits high transmittance within a visible band recording an optical band gap of 2 eV. The ideality factor, series resistance and barrier height of the organic heterostructure are extracted in dark and illumination conditions. It is observed that the current is space-charge limited (SCLC) and that the exponential distribution of trapping levels has the most influence on how traps affect the conduction current. Such organic heterostrcutures can meet photodiode and solar cell applications.
Keywords
MEH-PPV ; ; Optical measurement ; I-V characteristics ; heterostructure ; Conduction mechanism
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