Communication science et technologie
Volume 10, Numéro 1, Pages 117-125
2012-01-01
Vulnerability Study Of Embedded Circuits To Space Radiations Single Event Phenomena
Authors : Karoui S. .
Abstract
Abstract: The radiations in space environment with can induce failures disturbing the functionalities of the space applications embedded VLSI circuit. None means of prevention provide a total immunity. A solution consists to study and predict the sensitivity of components to be used in such applications, with an aim of choosing the least sensitive circuits. The objective of this work is to present
Keywords
Space environment / Heavy Ions / Upset / SEP Phenomenon / Functional Testers.
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